What is a burn in failure?

A burn-in failure refers to the early failure of electronic components or systems during a testing phase known as burn-in, where devices are subjected to elevated stress conditions to identify potential defects. This process helps weed out unreliable components before they are deployed in the field. Burn-in failures typically occur due to manufacturing defects, design flaws, or material issues that manifest under stress. Identifying these failures early can improve overall product reliability and longevity.