What is a Scanning Interferometric Apertureless Microscope used for?

A Scanning Interferometric Apertureless Microscope is used for high-resolution imaging and characterization of surfaces at the nanoscale. It employs interferometric techniques to measure the phase shifts of light scattered from a sharp probe that scans over the sample, enabling the visualization of topographical features and material properties with high precision. This method is particularly valuable in fields such as material science, Biology, and Nanotechnology for studying surface structures and interactions.